On March 20-21 NT-MDT held the «Tip-Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging» webinar.

 Tip-Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light diffraction. A deep integration of AFM with confocal Raman microscopy is required for successful TERS experiment.

Recent TERS results obtained by NT-MDT customers were reviewed at the webinar. Enhancement factors of a few orders of magnitude are observed using gold or silver TERS probes. 2D Raman maps with lateral resolution down to 10 nm are obtained for different types of samples: graphene, carbon nanotubes, organic molecules etc.

Dr. Pavel Dorozhkin, Head of NT-MDT Product Management and Application Division, was the webinar speaker.

Source: NT-MDT website